Features
- Line times down to 20 µs, or 15 µs in ADC low-OSR mode
- Binning mode (half the number of effective channels) for faster readout speed down to 10 µs
- Selectable parameters: input charge range, holes or electrons polarity, detector timing, low-pass filter time constant and line time
- Up to three different internal charge pump cycles for offset adjusting, signal emulation and switch charge injection compensation
- Four power modes in addition to sleep and full power-down modes
- Correlated Double Sampling for offset subtraction with programmable time constant
Benefits
- Flexible programming options to optimize for application needs
- Suitable to a wide range of detector sizes, supporting line capacitances up to 200 pF
- Best-in-class figure of merit for noise, power consumption and speed
- High-speed for dynamic applications
- Ultra-low power for portable applications
- Low-noise for great image quality
- Accurate temperature feedback
- Chip-on-flex packaging suitable to ACF bonding on the detector side and to a low-cost standard connector on the PCB side
